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Microelectronics Reliability《微电子学可靠性》
月刊 - 英国
  • Microelectronics Reliability《微电子学可靠性》
  • SCIE外文期刊
  • 期发文量13
  • 国人占比43.59%
  • 知网外文库
  • 投稿方式--官网投稿
  • 期刊属性

  • 中科分区:3区
    OA期刊:混合
  • 综述期刊:
    TOP期刊:
  • 期均国文:6
    环比增速:25.00%
  • 期刊信息

  • 研究方向:工程技术-ENGINEERING, ELECTRICAL ELECTRONIC工程:电子与电气;NANOSCIENCE NANOTECHNOLOGY纳米科技;PHYSICS, APPLIED物理:应用
  • 国际刊号:ISSN 0026-2714;EISSN 1872-941X
  • 期刊语言:英语
    出版地区:英国
  • 投稿网址:https://www.editorialmanager.com/micrel
  • 电子邮箱:
  • 期刊官网:https://www.sciencedirect.com/journal/microelectronics-reliability
  • 作者指南:
  • 出版商网址:http://www.elsevier.com
  • 出版地址:PERGAMON-ELSEVIER SCIENCE LTD , THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OX5 1GB
  • 期刊简介:Microelectronics Reliability《微电子学可靠性》(月刊). Microelectronics Reliability, is dedicated to disseminating the latest research results and related information on the reliability of microelectronic devices, circuits and systems, from materials, process and manufacturing, to design, testing and operation. The coverage of the journal includes the following topics: measurement, understanding and analysis; evaluation and prediction; modelling and simulation; methodologies and mitigation. Papers which combine reliability with other important areas of microelectronics engineering, such as design, fabrication, integration, testing, and field operation will also be welcome, and practical papers reporting case studies in the field and specific application domains are particularly encouraged.

  • 万维提示


  • 1、投稿方式:在线投稿。

    2、期刊网址:

    https://www.sciencedirect.com/journal/microelectronics-reliability

    3、投稿网址:https://www.editorialmanager.com/micrel

    4、期刊刊期:月刊,一年出版12期。

    2022年1026日星期






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